Head-disk interference (hdi) detection

ABSTRACT

Method and apparatus for detecting head disk interference (HDI). In accordance with some embodiments, a bias calibration circuit is adapted to respectively bypass or amplify a head disk interference (HDI) signal output from an HDI sensor responsive to a bias voltage adjusted according to a first control signal. A detection circuit is adapted to compare a swing range of a signal output from the bias calibration circuit and a swing range of a reference signal, and to output the first control signal responsive to said comparison.

RELATED APPLICATION

The present application makes a claim of foreign priority under 35U.S.C. §119(a) to Korean Application No. 10-2011-0065095 filed Jun. 30,2011.

BACKGROUND

When a head and a disk become close or in contact with each other in ahard disk drive (HDD), the head and the disk may be damaged so the headcannot properly process a signal output to the disk. Thus, there may bea problem with quality of the HDD.

SUMMARY

Various embodiments of the present disclosure are generally directed todetecting head-disc interference (HDI), such as in a hard disk drive(HDD).

In accordance with some embodiments, a bias calibration circuit isadapted to respectively bypass or amplify a head disk interference (HDI)signal output from an HDI sensor responsive to a bias voltage adjustedaccording to a first control signal. A detection circuit is adapted tocompare a swing range of a signal output from the bias calibrationcircuit and a swing range of a reference signal, and to output the firstcontrol signal responsive to said comparison.

These and other features and advantages of various embodiments willbecome more apparent from the following detailed description when readin conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic block diagram of a data storage device accordancewith some embodiments of the present disclosure.

FIG. 2 is a schematic block diagram of a pre-amplifier illustrated inFIG. 1.

FIG. 3 is a view illustrating a process of outputting an HDI faultsignal according to an operation of the pre-amplifier illustrated inFIG. 2.

FIG. 4 is a flow chart illustrating a detection method of operating thepre-amplifier illustrated in FIG. 2.

FIG. 5 is a schematic block diagram of a computer system including thedevice in FIG. 1.

DETAILED DESCRIPTION

Particular structural or functional descriptions of embodimentsaccording to the present disclosure are merely illustrative, and thesubject matter of the disclosure may be implemented in various forms andis not limited to the embodiments described herein.

FIG. 1 is a schematic block diagram of a data storage device accordingto some embodiments of the present disclosure. The device ischaracterized as a hard disk drive IOU which includes a plurality ofdisks 10, a plurality of heads (transducers) 12, a head assembly 14, apre-amplifier 40, a circuit block 18, a motor control block (or servocontrol block) 30, a spindle motor 36, and a voice coil motor (VCM) 38.

Each of the plurality of disks 10 may store data and are rotated by thespindle motor 36. Each of the plurality of heads 12 is positioned over acorresponding hard disk among the plurality of disks 10 to perform areading operation or a writing operation and installed in support arms13 extending toward the plurality of disks 10 from the head assembly 14coupled to the voice coil motor 38.

When data stored any one of the plurality of disks 10 is read, thepre-amplifier 40 amplifies a read signal output from a read head (12-1in FIG. 2) implemented in any one of the plurality of heads 12, andoutputs the amplified read signal to the read/write channel circuit 20.Or, the pre-amplifier 40 outputs an HDI fault signal FLT to the harddisk controller 22.

When data is written to any one of the plurality of disks 10, thepre-amplifier 40 transmits a write signal, e.g., a write current, outputfrom the read/write channel circuit 20, to any one of the plurality ofheads 12. Thus, the write head (12-2 in FIG. 2) implemented in an one ofthe heads may write the write signal to any one of the plurality ofdisks 10.

The read/write channel circuit 20 converts the read signal which hasbeen amplified by the pre-amplifier 40 into read data RDATA, and outputsthe read data RDATA to the hard disc controller (HDC) 22. Also, theread/write channel circuit 20 write data WDATA output from the hard diskcontroller 22 into a write signal, and outputs the write signal to thepre-amplifier 40.

When data is written to any one of the plurality of disks 10, the harddisk controller 22 outputs write data output from a host to theread/write channel circuit 20 under the control of the CPU 24. Thus, thewrite data output from the host may be written to any one of theplurality of disks 10 through the read/write channel circuit 20, thepre-amplifier 40, and a corresponding head.

When data is read from the plurality of disks 10, the hard diskcontroller 22 may receive the data RDATA decoded by the read/writechannel circuit 20 and transmit the received read data to the hostthrough an interface under the control of the CPU 24.

The CPU 24 may read a control code or a boot code stored in a ROM (readonly memory) 26 and store the same in a RAM (random access memory) 28,and generally control an operation of the hard disk drive 100 or thehard disk controller 22 based on the control code or the boot codestored in the RAM 28. Thus, the CPU 24 may control a read operation orwrite operation of the hard disk drive 100.

The CPU 24 may receive a read command or a write command output from thehost through each interface connected to a bus, and control a servocontroller for controlling an operation of a spindle motor driving unit32 and a VCM driving unit 34 in order to control track seek or trackfollowing according to a received command.

In response to the control signal output from the hard disk controller22, the spindle motor driving unit 32 controls an operation of thespindle motor 36 for controlling rotation of the plurality of disks 10.

In response to a control signal for controlling a position of each ofthe plurality of heads 12 output from the hard disk controller 22, theVCM driving unit 34 generates a driving current for driving the voicecoil motor 38 and outputs the same to a voice coil of the voice coilmotor 38.

Thus, the voice coil motor 38 moves the plurality of heads 12 over atrack implemented in any one of the plurality of disks 10 storing datadesired to be read from the plurality of disks 10 according to adirection and level of the driving current. The head 12 moved by thevoice coil motor 38 outputs position information recorded on any one ofthe plurality of disks 10 to the pre-amplifier 40 according to a controlsignal output from the read/write channel circuit 20 or under thecontrol of the hard disk controller 22.

When the head 12 moves to a target track of any one of the plurality ofdisks 10, a disk formatter (not shown) of the hard disk controller 22outputs a servo gate signal to the read/write channel circuit 20.

The read/write channel circuit 20 reads a servo pattern recorded in theplurality of disks 10 in response to the servo gate signal.

A buffer memory 29 may temporarily store data exchanged between the harddisk drive 100 and the host. In a different embodiment, the buffermemory 29 may be implemented outside the circuit block 18.

According to an embodiment, the circuit block 18 including theread/write channel circuit 20, the hard disk controller 22, the CPU 24,the ROM 26, and the RAM 28 may be implemented as a single chip, e.g., anSoC (System on Chip). Also, the motor control block 30 including thespindle motor driving unit 32 and the VCM driving unit 34 may beimplemented as a single chip, e.g., an SoC.

FIG. 2 is a schematic block diagram of a pre-amplifier illustrated inFIG. 1, and FIG. 3 is a view illustrating a process of outputting an HDIfault signal according to an operation of the pre-amplifier illustratedin FIG. 2.

In FIG. 2, a single head 12 is illustrated for the convenience ofexplanation. The head 12 includes a read head 12-1, a write head 12-2,an FOD (flying on demand) sensor 12-3, and an HDI (head diskinterference) sensor 12-4.

The read head 12-1 indicates an element for reading a read signal from adisk, and the write head 12-2 indicates an element for writing a writesignal to a disk.

The FOD (flying on demand) 12-3 is an element for detecting an FOD(flying on demand) voltage signal required for calculating a flyingheight of the head 12. The HDI (head disk interference) sensor 12-4 isan element for detecting an HDI signal HDI-S including information fordetecting whether or not HDI (also referred to as head mediainterference, HMI) has occurred.

With reference to FIG. 2, the pre-amplifier 40 includes a compensationcircuit 41, a detection circuit 42, a filter 43, and a comparator 45.The pre-amplifier 40 may further include a second amplifier 44.

The compensation circuit 41 includes a bias calibration circuit 41-1 anda first amplifier 41-2.

In FIG. 2, the compensation circuit 41 including a bias calibrationcircuit 41-1 and a first amplifier 41-2 is illustrated as an embodimentof the present disclosure, but the compensation circuit 41 may includeany one of the bias calibration circuit 41-1 and the first amplifier41-2.

When the compensation circuit 41 includes only the bias calibrationcircuit 41-1, the detection circuit 42 may compare a swing range of anoutput signal S1 or S2 of the bias calibration circuit 41-1 and a swingrange of a reference signal, and generate a first control signal CTL1having a different value according to the comparison results. Here, thefirst control signal CTL1 may include 1 bit or more bits. The biascalibration circuit 41-1 may adjust a bias voltage for amplifying an HDIsignal HDS-S according to the first control signal CTL1.

When the compensation circuit 41 includes only the first amplifier 41-2,the detection circuit 42 may compare a swing range of an output signalS1 or S2 of the first amplifier 41-2 and the swing range of thereference signal, and generate a second control signal CTL2 having adifferent value according to the comparison results. Here, the secondcontrol signal CTL2 may include 1 bit or more bits. The first amplifier41-2 may adjust a gain for amplifying an HDI signal HDS-S according tothe first control signal CTL1.

As illustrated in FIG. 2, the bias calibration circuit 41-1 may bypassthe HDI signal HDS-S output from the head 12, e.g., the HDI sensor 12-4,in response to the first control signal CTL1 e.g., the first controlsignal having a first value, output from the detection circuit 42, ormay amplify the HDI signal HDS-S output from the HDI sensor 12-4 andtransmit the amplified HDI signal to the first amplifier 41-2 inresponse to the first control signal CTL1 having a second value.

The first amplifier 41-2 may bypass the signal BS output from the biascalibration circuit 41-1 in response to the second control signal CTL2,e.g., the second control signal CTL2 having a third value, output fromthe detection circuit 42, or may amplify the signal BS output from thebias calibration circuit 41-1 in response to the second control signalCTL2 having a fourth value.

The detection circuit 42 compares the swing range of the output signalS1 or S2 from the first amplifier 41-2 with the swing range of thereference signal, and when the swing range of the output signal S1 or S2is equal to or greater than the swing range of the reference signal, thedetection circuit 42 may output the first control signal having a firstvalue or the second control signal CTL2 having a third value forcontrolling the compensation circuit 41 to bypass the HDI signal HDI-S.

However, according to the comparison het n the swing range the outputsignal S1 or S2 from the first amplifier 41-2 and the swing range of thereference signal, when the swing range of the output signal S1 or S2 issmaller than the swing range of the reference signal, the detectioncircuit 42 may output the first control signal CTL1 having a first valueor the second control signal CTL2 having a fourth value for controllingthe compensation circuit 41 to amplify the HDI signal HDI-S.

According to an embodiment, the first control signal CTL1 and the secondcontrol signal CTL2 may he output simultaneously or at a mutuallydifferent time.

The filter 43 filters the first signal S1 or the second signal S2 outputfrom the compensation circuit 41 to output a filtered signal FS. For theconvenience of explanation, the first signal S1 will be referred to as a‘bypassed signal’ (or “non-amplified signal”) by the compensationcircuit 41 and the second signal S2 will be referred to as an ‘amplifiedsignal’ by the compensation circuit 41.

For example, when the swing range of the HDI signal HDI-S, namely, thefirst signal S1, output from the HDI sensor 12-4 is greater than theswing range of the reference signal, the HDI signal HDI-S, namely, thefirst signal S1, is bypassed by the compensation circuit 41. However,when the swing range of the HDI signal HDI-S, namely, the first signalS1, output from the HDI sensor 12-4 is equal to or smaller than theswing range of the reference signal, the HDI signal HDI-S, namely, thefirst signal S1, is amplified to the second signal S2 by thecompensation circuit 41. He the swing range may refer to a peak-to-peakof a subject signal.

The second amplifier 44 amplifies the signal FS output from the filter43, and transmits the amplified signal AS to the comparator 45.

As shown in FIG. 3, the comparator 45 compares the signal AS amplifiedby the second amplifier 44 and a reference voltage signal VREF, and whenthe amplified signal AS is greater than the reference signal VREF, thecomparator 45 outputs an HDI fault signal FLT.

For example, 101 denotes the HDI signal HDI-S output from the HDI sensor12-4. namely, the HDI signal HDI-S before being amplified by thecompensation circuit 41, and 102 denotes the HDI signal HDI-S amplifiedby the compensation circuit 41.

When the swing range of the HDI signal HDI-S is equal to or smaller thanthe swing range of the reference signal, the comparator 45 outputs theHDI fault signal FLT having a low level.

However, although the swing range of the HDI signal HDI-S output fromthe HDI sensor 12-4 is smaller than the swing range of the referencesignal, since the compensation circuit 41 sequentially amplifies the HDIsignal HDI-S by using the control signals CTRL1 and CTRL2 output fromthe detection circuit 42 and outputs the amplified signal 102, thecomparator 45 may output the HDI fault signal FLT having a high level.For example, the comparator 45 may output the HDL fault signal FLThaving a high level in portions A in which the level or the amplifiedsignal 102 is greater than the level a the reference voltage signalVREF.

FIG. 4 is a flow chart illustrating a detection (detect) method ofoperating the pre-amplifier illustrated FIG. 2.

With reference to FIGS. 1 through 4, the compensation circuit 41 outputsthe first signal S1 (S40).

The detection circuit 42 compares the swing range of the first signal S1output from the compensation circuit 41 with the swing range of thereference signal, and generates the first control signal CTRL1 and thesecond control signal CTRL2 (S42).

For example, when the swing range of the First signal S1 output from thecompensation circuit 41 is greater than the swing range of the referencesignal (YES), the detection circuit 42 generates the first controlsignal CTRL1 having a first value and the second control signal CTRL2having a third value. Thus, the bias calibration circuit 41-1 and thefirst amplifier 41-2 bypass the HDI signal HDI-S output from the HDIsensor 12-4, respectively (S44).

However, when the swing range of the first signal Si output from thecompensation circuit 41 is equal to or smaller than the swing range ofthe reference signal (NO), the detection circuit 42 generates the Firstcontrol signal CTRL I having a second value and the second controlsignal CTRL2 having a fourth value. Thus, since the bias voltage of thebias calibration circuit 41-1 and the gain of the first amplifier 41-2an adjusted, the bias calibration circuit 41-1 and the first amplifier41-2 amplify the HDI signal HDI-S output from the HDI sensor 12-4 andoutput the amplified second signal 62 (S46).

Subsequently, the bias voltage-adjusted bias calibration circuit 41-1and the gain-controlled first amplifier 41-2 amplify the HDI signalHDI-S output from the HDI sensor 12-4, the swing range of the secondsignal S2 output from the compensation circuit 41 is grater than theswing range of the reference signal. Thus, the detection circuit 42generates s the first control signal CTRL1 having a first value and thesecond control signal CTRL2 having a third value, so, the adjusted biasvoltage of the bias calibration circuit 41-1 and the adjusted gain ofthe first amplifier 41-2 are maintained as is.

FIG. 5 is a schematic block diagram of a computer system including thehard disk drive illustrated in FIG. 1.

With reference to FIGS. 1 through 5, a computer system 200 that may beimplemented as a personal computer (PC) or a laptop computer may includea hard disk drive 100 and a host 210 for exchanging data with the harddisk drive 100.

The host 210 includes a host CPU 211, a memory 213, and an interface214. The host CPU controls an operation of the host 210, and during awrite operation, the host CPU 211 may transmit data output from thememory 213 to a host interface 49 implemented in a circuit block 18 ofthe hard disk drive 100 through an interface 214.

The interface 214 and the host interface 49 may be implemented as a SATAinterface. Thus, the interface 214 and the host interface 49 mayexchange data by using a SATA protocol.

During a read operation, the interface 214 may store data transmittedfrom the host interface 49 implemented in the circuit block 18 of thehard disk drive 100, in a memory 213 under the control of the host CPU211.

The host CPU 211 may process the data stored in the memory 213, e.g.,display the data by using a display device. or may output the data byusing a printer connected to a peripheral device, e.g., a USB port.

Particular embodiments of the present disclosure have been illustratedand described. However, as the embodiments may be implemented in severalforms without departing from the characteristics thereof, it should alsobe understood that the above-described embodiments are not limited byany of the details of the foregoing description, unless otherwisespecified, but rather should be construed broadly within its scope asdefined in the appended claims.

1. An apparatus comprising: a bias calibration circuit adapted torespectively bypass or amplify a head disk interference (HDI) signaloutput from an HDI sensor responsive to a bias voltage adjustedaccording to a first control signal; and a detection circuit adapted tocompare a swing range of a signal output from the bias calibrationcircuit and a swing range of a reference signal, and to output the firstcontrol signal responsive to said comparison.
 2. The apparatus of claim1, wherein when the swing range of the signal output from the biascalibration circuit is equal to or greater than the swing range of thereference signal, the bias calibration circuit bypasses the HDI signalin response to the first control signal output from the detectioncircuit, and when the swing range of the signal output from the biascalibration circuit is smaller than the swing range of the referencesignal, the bias calibration circuit amplifies the MI signal in responseto the first control signal output from the detection circuit.
 3. Theapparatus of claim 1, further comprising: a filter adapted to filter thesignal output from the bias calibration circuit: and a comparatoradapted to compare an output signal from the filter with a referencevoltage signal, and to output an HDI fault signal when the output signalfrom the filter is greater than the reference voltage signal.
 4. Theapparatus of claim 1, further comprising a first amplifier adapted tobypass or amplify the signal output from the bias calibration circuitbased on a gain adjusted according a second control signal, wherein thedetection circuit compares a swing range of a signal output from thefirst amplifier and the swing range of the reference signal and outputsthe second control signal according to said comparison.
 5. The apparatusof claim 4, wherein when the swing range of the signal output from thefirst amplifier is equal to greater than the swing range of thereference signal, the first amplifier bypasses the signal output fromthe bias calibration circuit in response to the second control signaloutput from the detection circuit, and when the swing range of thesignal output from the first amplifier is smaller than the swing rangeof the reference signal, the first amplifier amplifies the signal outputfrom the bias calibration circuit in response to the second controlsignal output from the detection circuit.
 6. The apparatus of claim 4,further comprising: a filter adapted to filter the signal output fromthe first amplifier: and a comparator adapted to compare the outputsignal of the filter with a reference voltage signal, and to output anHDI fault signal when the output signal of the filter is greater thanthe reference voltage signal.
 7. The apparatus of claim 6, furthercomprising a second amplifier connected between the filter and thecomparator.
 8. The apparatus of claim 1, further comprising atransducing head adjacent a data storage surface, the HDI signalgenerated responsive to an instantaneous fly height of the head withrespect to the surface.
 9. The apparatus of claim 1, further comprisingan HDI sensor which generates the FIN signal responsive to aninstantaneous fly height of a data transducer with respect to a datastorage surface.
 10. An apparatus comprising: a data transducing headadjacent a data storage surface; ahead-disk interface (HDI) sensorcoupled to the head adapted to generate an HDI signal responsive to apotential contact event between the head and the surface; a biascalibration circuit adapted to respectively bypass or amplify the MDIsignal responsive to a first control signal; and a detection circ itadapted to compare a swing range of a signal output from the biascalibration circuit and a swing range of a reference signal, and tooutput the first control signal responsive to said comparison.
 11. Theapparatus of claim 10, wherein when the swing range of the signal outputfrom the bias calibration circuit is equal to or greater than the swingrange of the reference signal, the bias calibration circuit bypasses theMDI signal in response to the first control signal output from thedetection circuit, and when the swing range of the signal output fromthe bias calibration circuit is smaller than the swing range of thereference signal, the bias calibration circuit amplifies the HDI signalin response to the first control signal output from the detectioncircuit.
 12. The apparatus of claim 10, further comprising a firstamplifier adapted to bypass or amplify the signal output from the biascalibration circuit based on a gain adjusted according a second controlsignal, wherein the detection circuit compares a swing range of a signaloutput from the first amplifier and the swing range of the referencesignal and outputs the second control signal according to saidcomparison.
 13. A method comprising: generating a head disk interference(signal) responsive to a potential contact event between a datatransducer and a data storage surface; generating a first control signalresponsive to a swing range of the HDI signal and a swing range of areference signal; bypassing the HDI signal responsive to a first controlsignal having a first value; and amplifying the HDI signal responsive tothe second control signal having a second value.
 14. The method of claim13, further comprising: comparing the bypassed or amplified HDI signalto a reference voltage; and transmitting an HDI fault signal responsiveto said comparison.
 15. The method of claim 14, further comprisingadjusting an operation of the data transducer responsive to thetransmitted HDI fault signal.
 16. The method of claim 13, furthercomprising filtering the bypassed or amplified HDI signal.
 17. Themethod of claim 13, in which the bypassing step comprises transmitting asignal to an amplifier to not apply amplification to the HDI signal, andin which the amplifying step comprises transmitting a signal to theamplifier to apply amplification to the HDI signal.
 18. The method ofclaim 17, further comprising applying filtering to an output of theamplifier.
 19. The method of claim 18, further comprising using a secondamplifier to amplify an output of the filter.
 20. The method of claim19, further comprising using a comparator to compare an output of thefilter to a reference voltage, and transmitting an output of thecomparator to a controller.